Development of a Side-View System for Atomic Force Microscopy (AFM)

Vitor Lucena Fabianski Campos; Valmara Silveira Ponte; Milena Ventura Castro Meira; Valéria Loureiro da Silva

doi:10.34178/jbth.v8i3.503

Vitor Lucena Fabianski Campos
Valmara Silveira Ponte
Milena Ventura Castro Meira
Valéria Loureiro da Silva

DOI: https://doi.org/10.34178/jbth.v8i3.503

Keywords: Atomic Force Microscopy, Imaging System, Characterization

Abstract

This study presents the development of a side-view imaging system for atomic force microscopy (AFM). The system consists of a monochromatic camera, two lenses, a light source, and image processing software. Six qualitative tests were conducted to evaluate the system's field of view and resolution. The field of view tests used a target positioned both horizontally and vertically. In contrast, the high-resolution test was conducted with the target fixed horizontally and an exposure time of 3,000 milliseconds in both tests. The results allowed the evaluation of the optical system's performance. They demonstrated its feasibility for side imaging in the AFM system under development at the Optics Laboratory, ensuring greater precision in the probe's approach to the sample.